The Age of Big Data requires immense data storage capacities, but this trend has unfortunately resulted in deteriorating reliability characteristics for the underlying storage medium. In a modern flash-based storage, a number of sophisticated techniques, both hardware and software, work in tandem to provide an illusion of a healthy storage, but at the cost of internal maintenance overheads and performance degradation. In this talk, I will present our findings on the performance impact of reliability enhancement techniques in modern flash storages. Based on the observation, I will then suggest that perhaps we should relax the fixed-capacity constraint in the block device interface.
Towards Performant and Reliable Flash-Based Storages
Bryan S. Kim
Seoul National University
Sondertermin (APB 3105 9:30)